Kwok Ng

Title: **Kwok Ng: Innovator in Yield Critical Defects Management**

Introduction

Kwok Ng, an accomplished inventor located in Milpitas, California, has made significant contributions to the field of semiconductor inspection. With a total of two patents to his name, his work primarily revolves around improving methods and systems for identifying and managing yield critical defects in wafer production.

Latest Patents

Kwok Ng's latest patents focus on "Based sampling and binning for yield critical defects." These innovative methods provide systems for design-based sampling and binning, which are essential in managing defects. One key method involves aligning each image patch from inspection images generated for a wafer with the design information. Additionally, it includes deriving multiple layer design attributes at the locations of defects identified in these image patches. This process culminates in building a decision tree that separates defects into bins based on their yield impact on devices being formed on the wafer. Ultimately, this decision tree facilitates efficient binning of the defects, allowing for improved yield management.

Career Highlights

Kwok Ng works at Kla Tencor Corporation, a leading company in the semiconductor inspection and measurement space. His innovative approach has earned him recognition and a solid reputation among peers in the industry. The techniques he has developed are aiding in the advancement of semiconductor manufacturing processes by reducing defect rates and optimizing yields.

Collaborations

Throughout his career, Kwok has collaborated with talented coworkers such as Satya Kurada and Raghav Babulnath. These partnerships have contributed to advancements in the rigorous field of semiconductor inspection, showcasing the importance of teamwork and shared knowledge in driving innovation forward.

Conclusion

Kwok Ng's contributions to the field of yield critical defects management highlight the essential role of inventors in technological advancements within the semiconductor industry. His work not only impacts his company but also paves the way for improving manufacturing processes in the broader market. As he continues to innovate, his patents stand as a testament to his influence in the quest for higher yield efficiency in wafer production.