Kurt Ulrich Neugebauer

Title: Kurt Ulrich Neugebauer: Semiconductor Security Innovation

Introduction

Kurt Ulrich Neugebauer is an inventor based in Vaterstetten, Germany. His patent work concerns detecting electromagnetic fault-injection attempts against semiconductor secure elements. He is associated with NXP B.V.

Latest Patents

Neugebauer is named on 1 patent: “Jitter Applied Detection for Semiconductor Secure Element.” The invention describes generating a test waveform containing a pulse and coupling it through an inductive loop to a secure element and an electromagnetic signal. The resulting observed waveform is compared with the test waveform to measure a temporal change. Comparing that change with a reference can help determine whether an electromagnetic fault-injection event has occurred. The secure element includes a flip-flop.

Career Highlights

The patent reflects work on monitoring secure semiconductor components for timing changes that may indicate electromagnetic interference or deliberate fault injection. Such detection methods can support the protection of secure elements against attacks that seek to disrupt their operation.

Collaborations

Neugebauer’s listed coworkers include Nicolas Louis Bernard Nabor Hemmerle and Devesh Pratap Singh. Their names appear alongside his in connection with the patent information provided.

Conclusion

Kurt Ulrich Neugebauer’s patent focuses on detecting electromagnetic fault injection through waveform timing analysis, contributing to research in semiconductor security.