The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2026

Filed:

Dec. 09, 2024
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Kurt Ulrich Neugebauer, Vaterstetten, DE;

Nicolas Louis Bernard Nabor Hemmerle, Munich, DE;

Devesh Pratap Singh, Bijnor, IN;

Younes Benlakhouy, Grasbrunn, DE;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G01R 31/317 (2006.01); G06F 21/76 (2013.01); H10W 42/40 (2026.01);
U.S. Cl.
CPC ...
H10W 42/405 (2026.01); G06F 21/55 (2013.01); G06F 21/76 (2013.01);
Abstract

A method for jitter applied detection for a semiconductor secure element including generating a test waveform comprising a test pulse. The test waveform is modulated with an inductive loop coupled to a secure element and to an Electromagnetic (EM) signal to generate an observed waveform comprising an observed pulse, wherein the secure element comprises a flip-flop. A temporal change is measured between the test pulse and the observed pulse and the temporal change is compared to a reference to determine an Electromagnetic-Fault-Injection (EMFI) event.


Find Patent Forward Citations

Loading…