Kuong H Hii

Title: Kuong H Hii - Innovator in Memory Testing Technology

Introduction

Kuong H Hii is a notable inventor based in Singapore, recognized for his contributions to memory testing technology. He has developed innovative solutions that enhance the efficiency and reliability of memory units. His work is particularly significant in the field of built-in self-test (BIST) units, which are crucial for ensuring the functionality of memory systems.

Latest Patents

Kuong H Hii holds a patent for an "Apparatus and method for subarray testing in dynamic random access." This invention involves a sophisticated address limits unit that stores start and stop addresses prior to testing procedures. Upon initiation by the BIST unit, the start address is transferred to address counters, serving as the initial test address. The stop address is also transferred, allowing for a comparison with the current address. When these addresses match, the test procedure is terminated, enabling the selection of any subarray in the memory unit for testing. This innovation streamlines the testing process and enhances the reliability of memory units.

Career Highlights

Kuong H Hii is currently employed at Texas Instruments Corporation, where he continues to develop cutting-edge technologies in the field of memory systems. His expertise and innovative mindset have made significant contributions to the company's advancements in electronic components.

Collaborations

Throughout his career, Kuong has collaborated with esteemed colleagues, including Danny R Cline and Theo J Powell. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

In summary, Kuong H Hii is a distinguished inventor whose work in memory testing technology has made a lasting impact on the industry. His innovative patent and contributions at Texas Instruments Corporation highlight his commitment to advancing technology in this critical field.