The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 1999

Filed:

Apr. 29, 1997
Applicant:
Inventors:

Kuong H Hii, Singapore, CN;

Danny R Cline, Dallas, TX (US);

Theo J Powell, Dallas, TX (US);

Wah K Loh, Richardson, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 36523003 ; 36523006 ; 365236 ;
Abstract

In a built-in-self-test (BIST) unit or a memory unit, an address limits unit is provided which, prior to initiation of the test procedures, has start and stop addresses stored therein. Upon the initiation of the test procedures by the BIST unit, the start address of the address limits unit is transferred to the address counters units wherein the start address serves as the initial test address. The stop address is transferred to the address counters unit wherein the stop address will be compared with the current address. When the stop address and the current address match, the test procedure being executed by the BIST unit will be terminated. In this manner, any subarray in the memory unit can be selected for test.


Find Patent Forward Citations

Hii, Kuong. (1999). Apparatus and method for subarray testing in dynamic random access (U.S. Patent No. 5923599). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5923599

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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