Miaoli, Taiwan

Kuo-Chien Wu

This inventor holds 1 USPTO granted patent. Top assignee: Holtek Microelectronics Inc.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kuo-Chien Wu. Retrieved from https://idiyas.com/inventor/kuo-chien-wu-af282ri7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Kuo-Chien Wu: Innovator in Polysilicon Manufacturing

Introduction

Kuo-Chien Wu is a notable inventor based in Maio Li, Taiwan. He has made significant contributions to the field of polysilicon manufacturing, particularly with his innovative methods that enhance the efficiency and precision of production processes. His work is recognized for its potential impact on various applications in the semiconductor industry.

Latest Patents

Kuo-Chien Wu holds a patent for a method of manufacturing polysilicon with relatively small line widths. This patent outlines a comprehensive process that includes several steps: forming a first layer of photoresist with a specific line pattern, etching portions of polysilicon, and depositing a polysilicon film. The method aims to achieve precise control over line intervals and widths, which is crucial for modern electronic components.

Career Highlights

Kuo-Chien Wu is currently associated with Holtek Microelectronics Inc., where he applies his expertise in semiconductor technology. His role at the company allows him to further develop and refine his innovative methods, contributing to advancements in the industry.

Collaborations

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Conclusion

Kuo-Chien Wu's contributions to polysilicon manufacturing exemplify the importance of innovation in the semiconductor industry. His patented methods not only enhance production efficiency but also pave the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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