Gunma, Japan

Kuniyuki Kaneko

This inventor holds 1 USPTO granted patent. Top assignee: Adv Antest Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kuniyuki Kaneko. Retrieved from https://idiyas.com/inventor/kuniyuki-kaneko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Kuniyuki Kaneko: Innovator in Testing Technology

Introduction

Kuniyuki Kaneko is a notable inventor based in Gunma, Japan. He has made significant contributions to the field of testing technology, particularly through his innovative patent. His work focuses on enhancing the efficiency and accuracy of testing devices.

Latest Patents

Kuniyuki Kaneko holds a patent for a test apparatus and test method. This invention provides a test apparatus that tests a device under test with multiple output terminals. The apparatus includes an executing section that carries out a test command sequence, a storage section for setting data, a detecting section to verify output signals, and a selecting section that manages different pieces of setting data based on detection results. This innovative approach allows for more effective testing of devices.

Career Highlights

Kuniyuki Kaneko is currently employed at Adv Antest Corporation, where he continues to develop and refine testing technologies. His expertise in this area has positioned him as a valuable asset to his company and the industry.

Collaborations

He collaborates with Naoyoshi Watanabe, working together to advance their projects and contribute to the field of testing technology.

Conclusion

Kuniyuki Kaneko's contributions to testing technology through his patent demonstrate his innovative spirit and commitment to improving device testing methods. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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