Tokyo, Japan

Kunito Hayashi

This inventor holds 2 USPTO granted patents. Top assignees: Crestec Corporation, Konica-Minolta Holdings, Inc., Ricoh Company, Ltd.. Active years: 2006-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kunito Hayashi. Retrieved from https://idiyas.com/inventor/kunito-hayashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2006-2012

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2 patents (USPTO):Explore Patents

Title: Kunito Hayashi: Innovator in Electron Beam Technology

Introduction

Kunito Hayashi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electron beam technology, holding two patents that showcase his innovative approaches to aberration evaluation and electron beam writing methods.

Latest Patents

Hayashi's latest patents include a method for evaluating astigmatism in irradiation systems and a device for high-speed, precise electron beam writing. The first patent discloses a technique for detecting the direction and magnitude of astigmatism by forming a figure pattern on a reference sample and analyzing the scanned image. The second patent focuses on a device that calculates the distance of a writing pattern and optimizes the scanning process to achieve high precision at high speeds.

Career Highlights

Throughout his career, Kunito Hayashi has worked with notable companies such as Crestec Corporation and Ricoh Company, Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electron beam technology.

Collaborations

Hayashi has collaborated with esteemed colleagues, including Kazuhiko Kobayashi and Hiroyuki Miyata. Their combined expertise has fostered innovation in their respective fields.

Conclusion

Kunito Hayashi's work in electron beam technology exemplifies the spirit of innovation. His patents reflect a commitment to advancing precision and efficiency in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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