This inventor holds 2 USPTO granted patents. Top assignees: Dainippon Screen Mfg. Co., Ltd., Screen Holdings Co., Ltd.. Active years: 2005-2015.
Company Filing History:
1 out of 1,306 
1 out of 1,123 
Years Active: 2005-2015
Title: Kunio Ueta: Innovator in Substrate Inspection Technologies
Introduction
Kunio Ueta is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of substrate inspection technologies, holding a total of 2 patents. His work focuses on enhancing the precision and efficiency of substrate inspection processes.
Latest Patents
Ueta's latest patents include a substrate inspection apparatus and a substrate inspection method. The substrate inspection apparatus is designed to detect conditions of an EBR line at a substrate edge. It features a turntable for rotating a substrate with a coated film, a light irradiator, and a photoelectric converter that captures specularly reflected light from the substrate. This apparatus generates a two-dimensional image by adding detection values of electrical signals corresponding to one radial scan from the center of the substrate for one turn of the rotator. A changing point is then judged using a judgment band set along one direction of the two-dimensional image.
Another significant patent is the color filter inspection apparatus. This apparatus includes an image pickup part that performs image capture of a color filter traveling along guide rails. It utilizes a line sensor and a fluorescence lamp to irradiate the color filter from below. An optical filter is attached to the image pickup part, which transmits light in a predetermined wavelength band. This design allows for high-precision inspection of unevenness in color of the color filter with respect to one color component filter.
Career Highlights
Throughout his career, Kunio Ueta has worked with prominent companies such as Dainippon Screen Manufacturing Co., Ltd. and Screen Holdings Co., Ltd. His experience in these organizations has contributed to his expertise in substrate inspection technologies.
Collaborations
Ueta has collaborated with notable coworkers, including Kazutaka Taniguchi and Taigo Nakajima. Their collective efforts have further advanced the field of substrate inspection.
Conclusion
Kunio Ueta's innovative work in substrate inspection technologies has led to the development of advanced apparatuses that enhance inspection precision. His contributions are significant in the realm of manufacturing and quality control.