Kyoto, Japan

Kunio Tomohisa


Average Co-Inventor Count = 3.0

ph-index = 10

Forward Citations = 248(Granted Patents)


Company Filing History:


Years Active: 1987-1992

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12 patents (USPTO):Explore Patents

Title: Kunio Tomohisa: Innovator in Optical Systems

Introduction

Kunio Tomohisa is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of optical systems, holding a total of 12 patents. His innovative work has advanced the technology used in image reproduction and beam detection.

Latest Patents

One of his latest patents is a method of generating a gradation correction curve for correcting gradation. This method involves preparing experiential gradation correction curves for sample images. By analyzing these curves and the accumulated density histograms of the sample images, specific points are determined to create a gradation correction curve that enhances image reproduction.

Another notable patent is a method and apparatus for detecting beam spot shape. This invention allows for the detection of the shape of a beam spot on a scanning plane in a scanning optical system. It utilizes multiple slits to measure light intensities and derive the moving speed of the light beam, which is crucial for determining the beam spot shape accurately.

Career Highlights

Kunio Tomohisa is associated with Dainippon Screen Mfg. Co., Ltd., a company known for its innovations in the manufacturing of printing and imaging equipment. His work has been instrumental in developing advanced technologies that improve optical systems.

Collaborations

Throughout his career, Tomohisa has collaborated with notable colleagues such as Masamichi Cho and Yasuo Kurusu. These partnerships have fostered a creative environment that has led to groundbreaking advancements in their field.

Conclusion

Kunio Tomohisa's contributions to optical systems through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence advancements in image reproduction and beam detection technologies.

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