The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 1992
Filed:
Oct. 31, 1990
Dainippon Screen Mfg. Co., Ltd., Kyoto, JP;
Abstract
A method and apparatus for detecting the shape of a beam spot on a scanning plane in a scanning optical system having a constant scanning speed. When a relative moving speed of the light beam is not known beforehand, four slits are used to detect intensities of light passing through the slits. Three of these slits have different angles of inclination with respect to a scanning direction, and the remaining slit has the same angle of inclination as one of the three slits. When the moving speed of the light beam is known in advance, the first-mentioned three slits are used. The moving speed of the light beam is derived from a time lapse between signals detected through the two slits having the same angle of inclination. Once the moving speed of the light beam is known, periods of movement required for the light beam to traverse the three slits having different angles of rotation are obtained on the basis of detection signals relating to these slits. Then, distances of movement required for the light beam to traverse the three slits are derived from the periods and scanning speed, respectively. The three distances of movement thus obtained are used in determining the beam spot shape. Where knife edges are used instead of the slits, the above operation is carried out after differentiating signals detected through the knife edges.