Kunio Sano

Title: Kunio Sano: Innovator in Semiconductor Inspection Technology

Introduction

Kunio Sano is a prominent inventor based in Yamanashi-ken, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 12 patents. His work primarily focuses on methods and apparatuses for inspecting semiconductor integrated circuits, which are crucial for ensuring the quality and reliability of electronic devices.

Latest Patents

One of Kunio Sano's latest patents is a method and apparatus for inspecting semiconductor integrated circuits. This innovative wafer inspecting apparatus inspects the electric characteristics of IC chips on a wafer by examining the inspecting electrodes of all IC chips simultaneously. The apparatus features a contactor composed of multiple components, including a first contactor with numerous contact projections and electrodes, and a second contactor equipped with movable contact elements. This design allows for precise and efficient testing of semiconductor wafers, enhancing the reliability of electronic components.

Another notable invention is a probe device designed for testing wafers divided into IC chips. This device includes a vessel that houses a wafer mounting stand and a flexible probe card with contactor bumps. The configuration of the vessel is designed to minimize external electrical noise, ensuring stable electrical measurements. The innovative design also addresses thermal expansion issues, allowing for accurate positioning of the probe card during testing.

Career Highlights

Throughout his career, Kunio Sano has worked with notable companies in the semiconductor industry, including Tokyo Electron Limited and Tokyo Electron Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in semiconductor inspection technologies and has facilitated the development of his patented inventions.

Collaborations

Kunio Sano has collaborated with esteemed colleagues such as Takashi Sato and Toshihiro Yonezawa. These partnerships have likely played a role in advancing his research and innovations in the semiconductor field.

Conclusion

Kunio Sano's contributions to semiconductor inspection technology have significantly impacted the industry. His innovative patents and collaborations with leading companies and colleagues highlight his dedication to advancing technology in this critical field.