Kunio Sannomiya

Title: Kunio Sannomiya: Innovator in Optical Inspection and Image Processing

Introduction

Kunio Sannomiya is a notable inventor based in Atsugi, Japan. He has made significant contributions to the fields of optical inspection and image processing, holding a total of 9 patents. His work has had a profound impact on the technology used in various industries.

Latest Patents

Sannomiya's latest patents include a system for optically inspecting conditions of parts packaged on a substrate. This innovative system inspects the condition of parts on a printed-circuit board by utilizing a position detecting device that receives scattered light from a laser beam. The system converts this light into a position signal, which is then used to obtain luminance data and height data of the parts. By comparing the final height data with predetermined reference data, the inspection system can accurately determine the package condition.

Another significant patent is an image signal processing apparatus for bar code image signals. This apparatus processes input data values representing an array of picture elements from a source image containing bar code regions. The data is converted to bi-level values, which are stored in an image memory. The processing eliminates background black regions and computes the central position and slope of the bar code region, allowing for accurate reading of bar code data.

Career Highlights

Throughout his career, Kunio Sannomiya has worked with prominent companies such as Matsushita Electric Industrial Co., Ltd. and Matsushita Graphic Communication Systems, Inc. His experience in these organizations has contributed to his expertise in optical inspection and image processing technologies.

Collaborations

Sannomiya has collaborated with notable individuals in his field, including Hiroyoshi Tsuchiya and Katsuo Nakazato. These collaborations have further enhanced his innovative capabilities and contributions to technology.

Conclusion

Kunio Sannomiya is a distinguished inventor whose work in optical inspection and image processing has led to significant advancements in technology. His patents reflect his commitment to innovation and excellence in his field.