Location History:
- Uji, JP (1990)
- Kyoto, JP (1986 - 2004)
Company Filing History:
Years Active: 1986-2004
Title: Kunio Otsuki: Innovator in Film Thickness Measurement Technology
Introduction
Kunio Otsuki is a distinguished inventor based in Kyoto, Japan. He has made significant contributions to the field of optical measurement technology, particularly in the development of film thickness measuring apparatuses. With a total of 4 patents to his name, Otsuki continues to push the boundaries of innovation in his field.
Latest Patents
Otsuki's latest patents include a film thickness measuring apparatus that is capable of restricting a measurement area on the surface of a sample. This apparatus utilizes an incident optical system that provides irradiating polarized light to the sample's surface. The detecting optical system then receives the reflected light, which has an elliptical polarization, and provides a reduced aperture that restricts the light through a fiber optic conduit to a spectrometer, effectively eliminating aberrations and noise problems. Another notable patent is a spectral ellipsometer that includes a light incident optical system for focusing a spot of polarized light of multiple wavelengths onto a sample surface. This system employs a spherical prism polarizer, which allows for the focusing of incident light so that all ray traces of the range of wavelengths are focused at the same position on the sample surface.
Career Highlights
Kunio Otsuki is currently employed at Horiba, Ltd., a company renowned for its advanced scientific and analytical instruments. His work at Horiba has allowed him to collaborate with other talented professionals in the field, further enhancing the innovative capabilities of the company.
Collaborations
Some of Otsuki's notable coworkers include Kozo Ishida and Junji Okayama. Their collaborative efforts contribute to the ongoing advancements in measurement technologies at Horiba.
Conclusion
Kunio Otsuki's innovative work in film thickness measurement technology exemplifies the spirit of invention and progress. His contributions continue to impact the field positively, showcasing the importance of research and development in optical measurement.