This inventor holds 5 USPTO granted patents and 3 published patent applications. Top assignee: Hamamatsu-Photonics K.k.. Active years: 2025-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025-2026
Title: Kunihiko Tsuchiya: Innovator in Height Measurement Technology
Introduction
Kunihiko Tsuchiya is a notable inventor based in Hamamatsu, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative height measurement apparatus. His work exemplifies the intersection of engineering and practical application in scientific measurement.
Latest Patents
Tsuchiya holds a patent for a height measurement apparatus and method. This apparatus includes a light irradiation unit that irradiates a sample with light, a camera system that detects the light from the sample, and a control apparatus that calculates the height of the sample based on wavelength information. The camera system features an inclined dichroic mirror that separates light by transmitting and reflecting it, along with light detectors that measure the reflected and transmitted light quantities. The processing unit then calculates the wavelength information based on the ratio of these quantities, providing accurate height measurements.
Career Highlights
Kunihiko Tsuchiya is associated with Hamamatsu Photonics K.K., a company renowned for its advancements in optical technologies. His role in the company has allowed him to develop and refine his innovative measurement techniques. Tsuchiya's work has contributed to the company's reputation as a leader in photonics and measurement solutions.
Collaborations
One of Tsuchiya's notable collaborators is Tomonori Nakamura. Their partnership has likely fostered advancements in measurement technologies and contributed to the success of their projects.
Conclusion
Kunihiko Tsuchiya's contributions to height measurement technology through his innovative patent demonstrate his expertise and commitment to advancing measurement solutions. His work continues to impact the field positively, showcasing the importance of innovation in scientific measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
