Tainan, Taiwan

Kun-Hui Lin

This inventor holds 1 USPTO granted patent and 8 published patent applications. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kun-Hui Lin: Innovator in Image Sensor Technology

Introduction: Kun-Hui Lin is a prominent inventor based in Tainan, Taiwan. He has made significant contributions to the field of image sensor technology. His innovative work has led to the development of a unique patent that enhances the functionality of image sensors.

Latest Patents: Kun-Hui Lin holds a patent for an "Image sensor structure and method for forming the same." This patent describes an image sensor structure that includes a semiconductor substrate, a plurality of image sensing elements, a reflective element, and a high-k dielectric structure. The image sensing elements are integrated within the semiconductor substrate, while the reflective element is positioned between these elements. The high-k dielectric structure is strategically placed between the reflective element and the image sensing elements, optimizing the sensor's performance.

Career Highlights: Kun-Hui Lin is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work at this company has allowed him to push the boundaries of image sensor technology and contribute to advancements in the field.

Collaborations: Kun-Hui Lin has collaborated with Po Chun Chang, a fellow innovator in the industry. Their partnership has fostered the exchange of ideas and has led to further advancements in their respective fields.

Conclusion: Kun-Hui Lin's contributions to image sensor technology exemplify the spirit of innovation. His patent and work at Taiwan Semiconductor Manufacturing Company Limited highlight his role as a key player in advancing semiconductor technology.

Profile summary based on public USPTO records.
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