Beijing, China

Kun Han

This inventor holds 1 USPTO granted patent. Top assignees: Boe Technology Group Co., Ltd., Hefei Xinsheng Optoelectronics Technology Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kun Han. Retrieved from https://idiyas.com/inventor/kun-han-sbym2nbo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Kun Han - Innovator in Panel Testing Technology

Introduction

Kun Han is a notable inventor based in Beijing, China. He has made significant contributions to the field of panel testing technology. His innovative approach has led to the development of a unique device that enhances the efficiency of panel testing processes.

Latest Patents

Kun Han holds a patent for a panel testing device. This device includes a supporter and a plurality of test pins that correspond to signal pins on the tested panel. The design ensures that each test pin meets specific dimensional criteria, enhancing the accuracy and reliability of panel testing.

Career Highlights

Throughout his career, Kun Han has worked with prominent companies in the technology sector. He has been associated with BOE Technology Group Co., Ltd. and Hefei Xinsheng Optoelectronics Technology Co., Ltd. His work in these organizations has allowed him to refine his skills and contribute to advancements in optoelectronic technologies.

Collaborations

Kun Han has collaborated with talented individuals in his field, including Hao Liu and Ameng Zhang. These partnerships have fostered innovation and have been instrumental in the development of new technologies.

Conclusion

Kun Han's contributions to panel testing technology exemplify his dedication to innovation. His patent and career achievements reflect his expertise and commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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