The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2020

Filed:

Oct. 24, 2017
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, CN;

Inventors:

Yu Ai, Beijing, CN;

Xuewu Xie, Beijing, CN;

Bowen Liu, Beijing, CN;

Shi Sun, Beijing, CN;

Hao Liu, Beijing, CN;

Kun Han, Beijing, CN;

Ameng Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/3172 (2013.01); G09G 2320/0693 (2013.01);
Abstract

Disclosed is a panel testing device. The panel testing device includes: a supporter and a plurality of test pins disposed on the supporter, wherein the plurality of test pins are in one-to-one correspondence with a plurality of signal pins on the tested panel, any one of the test pins satisfies d≤D≤d+L; wherein D is a width of the test pin, d is a width of the signal pin corresponding to the test pin, L is a minimum pitch between two adjacent signal pins.


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