San Diego, CA, United States of America

Kumar Raj

This inventor holds 1 USPTO granted patent. Top assignee: Qualcomm Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kumar Raj. Retrieved from https://idiyas.com/inventor/kumar-raj-5ya7fqw8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Kumar Raj in Integrated Circuit Testing

Introduction

Kumar Raj is an accomplished inventor based in San Diego, CA. He has made significant contributions to the field of integrated circuit testing through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of testing integrated circuit designs.

Latest Patents

Kumar Raj holds a patent for a "Machine-learning-based integrated circuit test case selection." This patent outlines techniques and apparatus for testing integrated circuit designs. The method includes generating a coverage matrix associated with a plurality of test cases and coverage points. A subset of these test cases is selected for execution based on weights associated with each test case and a threshold weight value. The weights are derived from a machine learning model trained on the coverage matrix, allowing for optimized testing of integrated circuits.

Career Highlights

Kumar Raj is currently employed at Qualcomm Incorporated, a leading technology company known for its innovations in telecommunications and semiconductor technology. His work at Qualcomm has allowed him to apply his expertise in machine learning and integrated circuit design.

Collaborations

Kumar collaborates with talented coworkers, including Gokce Sarar and Guillaume Shippee. Their combined efforts contribute to advancing the field of integrated circuit testing and development.

Conclusion

Kumar Raj's innovative approach to integrated circuit testing through machine learning exemplifies the potential of technology to improve design processes. His contributions are paving the way for more efficient testing methodologies in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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