Hsinchu City, Taiwan

Kuei-Ming Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Industrial Technology Research Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kuei-Ming Lee. Retrieved from https://idiyas.com/inventor/kuei-ming-lee-9hsfcs4c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kuei-Ming Lee and a Patent for Multi-Link Device Calibration.

Introduction

Kuei-Ming Lee is an inventor associated with Hsinchu City, Taiwan, and the Industrial Technology Research Institute. The supplied information lists 1 patent for Lee.

Latest Patents

Lee’s listed patent is “Parameter Calibration Method, Parameter Calibration System and Non-Transitory Computer Readable Medium.” It describes a method for calibrating parameters in a multi-link device. The method establishes a kinematic model, uses a measurement tool to collect points on two parallel planes, and records the device’s parameter sets during measurement. It then creates target functions, updates the parameter sets, and determines a parameter modification by comparing the initial and updated sets.

Career Highlights

Lee’s listed invention addresses the calibration of multi-link devices through measured data and model-based parameter updates. The patent identifies the Industrial Technology Research Institute as the organization associated with Lee.

Collaborations

The available information connects Lee’s patent work with the Industrial Technology Research Institute. No additional collaborators are identified in the supplied details.

Conclusion

Kuei-Ming Lee’s listed patent presents a structured approach to improving multi-link device calibration by combining measurement, kinematic modeling, and parameter adjustment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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