The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Dec. 14, 2023
Industrial Technology Research Institute, Hsinchu, TW;
Chao-Ping Huang, Hsinchu City, TW;
Kuei-Ming Lee, Hsinchu City, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
A parameter calibration method includes: establishing a kinematic model function of the multi-link device, the kinematic model function comprising a parameter set; controlling the multi-link device to acquire N measurement points located on a first and a second planes of an object with a measurement tool, and recording N parameter sets as N initial parameter sets when the multi-link device acquires the N measurement points with the measurement tool, wherein the first and the second planes are parallel to each other and have a predetermined dimension; establishing a plurality of target functions associated with the N measurement points based on the N parameter sets and the kinematic model function; updating the N parameter sets based on the target functions to obtain N updated parameter sets; obtaining a parameter modification of the parameter set based on the N initial parameter sets and the N updated parameter sets.
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