Boise, ID, United States of America

Krunal Patel


Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2025

where 'Filed Patents' based on already Granted Patents

3 patents (USPTO):

Title: Innovations by Krunal Patel in Memory Technology

Introduction

Krunal Patel is an accomplished inventor based in Boise, ID (US), known for his significant contributions to memory technology. With a total of three patents to his name, Patel has made strides in error detection and correction systems for DRAM devices. His work is pivotal in enhancing the reliability and efficiency of memory controllers.

Latest Patents

Patel's latest patents focus on error detection, correction, and media management in memory devices. One of his notable inventions is a system and method that identifies memory errors requiring soft or hard package repair for rows of DRAM memory. When data is written to a row of DRAM, it is immediately read back and scanned for bit errors. If any bit errors are detected, the data is corrected and rewritten to the same memory location. The memory location is then re-read, and if errors persist, it is marked for repair. Additionally, a historical record of memory errors is reviewed to determine if similar issues have occurred previously, guiding the decision for soft or hard repairs.

Career Highlights

Krunal Patel is currently employed at Micron Technology Incorporated, a leading company in semiconductor manufacturing. His role involves developing innovative solutions that improve memory technology and address critical issues related to data integrity.

Collaborations

Patel has collaborated with notable colleagues, including Amitava Majumdar and Greg S. Hendrix, who share his commitment to advancing memory technology.

Conclusion

Krunal Patel's contributions to memory technology through his patents demonstrate his expertise and dedication to innovation. His work not only enhances the functionality of memory devices but also sets a foundation for future advancements in the field.

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