This inventor holds 1 USPTO granted patent. Top assignee: Schlumberger Technology Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Innovations by Krishna Kumar Narayanan Nair
Introduction
Krishna Kumar Narayanan Nair is an accomplished inventor based in Pune, India. He has made significant contributions to the field of machine learning and defect analysis. His innovative work focuses on enhancing industrial inspections through advanced technology.
Latest Patents
Krishna Kumar Narayanan Nair holds a patent for a machine learning-based defect analysis reporting and tracking system. This patent involves methods, systems, and computer program products designed for defect detection in industrial inspections. In one embodiment, captured images are ingested from a robotic platform equipped with imaging sensors. The ingested images are analyzed using an image analysis pipeline and a plurality of labeled images to generate a plurality of segmentation masks. In an environment shown in at least a subset of the plurality of ingested images, a plurality of environmental conditions are simulated to create an augmented plurality of labeled images. A defect analysis model is then trained with the augmented plurality of labeled images and the plurality of segmentation masks. This innovative approach significantly improves the accuracy and efficiency of defect detection processes.
Career Highlights
Krishna Kumar Narayanan Nair is currently employed at Schlumberger Technology Corporation, where he applies his expertise in machine learning and defect analysis. His work contributes to the advancement of technology in the industrial sector, making processes more efficient and reliable.
Collaborations
Some of his notable coworkers include Sunil Manikani and Olga Domanova. Their collaboration fosters a creative environment that encourages innovation and the development of cutting-edge solutions.
Conclusion
Krishna Kumar Narayanan Nair is a prominent inventor whose work in machine learning and defect analysis is paving the way for advancements in industrial inspections. His contributions are vital to enhancing the efficiency and accuracy of defect detection processes.