The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Dec. 15, 2023
Schlumberger Technology Corporation, Sugar Land, TX (US);
Sunil Manikani, Pune, IN;
Olga Domanova, Beijing, CN;
Krishna Kumar Narayanan Nair, Pune, IN;
Federico Sporleder, Pune, IN;
Ali Rezaei, Houston, TX (US);
Nasser Ghorbani, Houston, TX (US);
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
Methods, systems, and computer program products are provided for defect detection in industrial inspections. In one embodiment, captured images are ingested from a robotic platform equipped with imaging sensors. The ingested images are analyzed using an image analysis pipeline and a plurality of labeled images to generate a plurality of segmentation masks. In an environment shown in at least a subset of the plurality of ingested images, a plurality of environmental conditions are simulated to create an augmented plurality of labeled images. A defect analysis model is then trained with the augmented plurality of labeled images and the plurality of segmentation masks.