This inventor holds 1 USPTO granted patent. Top assignee: Nitto-Denko Corporation. Active years: 2010.
Company Filing History:
Years Active: 2010
Title: Kouji Shizen: Innovator in Layered Film Technology
Introduction
Kouji Shizen is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of layered film technology, particularly in defect detection methods. His innovative work has led to the development of a patented method that enhances the quality and reliability of layered films used in various applications.
Latest Patents
Kouji Shizen holds a patent for a layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device. This patent outlines a defect detection method for layered films that include a polarizing plate and an optical compensation layer. The method involves applying light from a light source positioned at the polarizing plate layer side of the film surface. An imaging unit captures the transmitting light image of the layered film, allowing for the detection of defects based on the captured image. The imaging process is enhanced by the use of an inspection polarizing filter and an inspection phase difference filter, which are strategically arranged in the optical path.
Career Highlights
Kouji Shizen is associated with Nitto-Denko Corporation, where he has been instrumental in advancing layered film technologies. His expertise in this area has contributed to the company's reputation for innovation and quality in the materials industry.
Collaborations
Kouji has collaborated with talented coworkers such as Michihiro Hagiwara and Yuuki Yano. Their combined efforts have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Kouji Shizen's work in layered film technology exemplifies the impact of innovation in enhancing product quality and performance. His patented methods are a testament to his expertise and dedication to advancing technology in this field.
