The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jan. 10, 2007
Takamasa Kobayashi, Ibaraki, JP;
Michihiro Hagiwara, Ibaraki, JP;
Yuuki Yano, Ibaraki, JP;
Kouji Shizen, Ibaraki, JP;
Takamasa Kobayashi, Ibaraki, JP;
Michihiro Hagiwara, Ibaraki, JP;
Yuuki Yano, Ibaraki, JP;
Kouji Shizen, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;
Abstract
A defect detection method of a layered film having a polarizing plate and an optical compensation layer includes steps of: applying light from a light source arranged at the polarizing plate layer side of the film surface of the layered film; a step of imaging a transmitting light image of the layered film by an imaging unit arranged at the optical compensation layer side of the film surface; and a defect detection step for detecting a defect existing on the layered film according to the transmitting light image captured by the imaging unit. The imaging unit performs imaging via an inspection polarizing filter arranged on the optical path between the light source and the imaging unit and adjacent to the imaging unit; and an inspection phase difference filter arranged on the optical path between the light source and the imaging unit and between the inspection polarizing filter and the layered film.