This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Namiki Seimitsu Houseki Kabushiki Kaisha. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: **Kouji Koyama: Innovator in Scanning Probe Microscopy**
Introduction
Kouji Koyama is a notable inventor based in Tokyo, Japan. With a focus on advancing scanning probe microscopy (SPM), he has made significant contributions to the field through his innovative patent.
Latest Patents
Kouji Koyama holds a patent for a unique probe and cantilever designed for use in scanning probe microscopes. His invention seeks to improve the manufacturability of a probe used in a cantilever, while effectively utilizing the properties of single-crystalline materials. The patent highlights a probe placed at the tip of the beam part of a cantilever for SPM applications. This probe features a needle-like part that measures at least 10 μm in length, along with a flat plate component that engages the cantilever's beam. Notably, these elements are integrally formed with a single-crystalline material, enhancing performance and indicating crystal orientation through a flat surface on at least one side face of the flat plate part.
Career Highlights
Kouji Koyama's expertise in material science and engineering has solidified his reputation within the innovative community. His employment at Namiki Seimitsu Houseki Kabushiki Kaisha has enabled him to leverage advanced materials in practical applications. The development of his patented technology has undoubtedly offered new opportunities in imaging and analysis at the nanoscale.
Collaborations
Throughout his career, Kouji Koyama has collaborated with notable professionals in his field, including Toshiro Kotaki and Kazuhiko Sunagawa. These partnerships have been essential in pushing the boundaries of research and innovation in scanning probe microscopy, contributing to advancements that benefit a myriad of scientific and engineering applications.
Conclusion
Kouji Koyama's ingenuity and commitment to innovation in scanning probe microscopy underscore the importance of collaboration and advanced material applications in modern technology. His patent for the probe and cantilever represents a significant step forward in the capability of SPM, reflecting his dedication to enhancing scientific exploration and understanding.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile