The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2012
Filed:
Jul. 15, 2010
Kouji Koyama, Tokyo, JP;
Toshiro Kotaki, Tokyo, JP;
Kazuhiko Sunagawa, Tokyo, JP;
Abstract
To provide a probefor use in a cantileverof an scanning probe microscope (SPM) manufacturable in a simple manufacturing process and usable while allowing full use of the properties of single-crystalline material and a cantileverusing that probe. A probedisposed at the tip of beam partof a cantileverused for an SPM, wherein the probecomprises a needle-like parthaving a length of not less than 10 μm or and a flat plate parthaving a face contacting a beam part of the cantilever, the needle-like partand the flat plate partare integrally formed with a single-crystalline material, and at least one side face of the flat plate partcontains a flat surfacein order to indicate the crystal orientation of the single-crystalline material.