Tokyo, Japan

Kouji Hayashi

This inventor holds 6 USPTO granted patents and 4 published patent applications and 1 EPO patent. Top assignees: Kabushiki Kaisha Yakult Honsha, Shikoku Kakoki Co., Ltd., Yokogawa Electric Corporation. Active years: 1997-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouji Hayashi. Retrieved from https://idiyas.com/inventor/kouji-hayashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 83.3

 

Average Co-Inventor Count = 2.0

ph-index = 4

Forward Citations = 65(Granted Patents)


Location History:

  • Hino, JP (2013)
  • Tokyo, JP (1997 - 2020)
  • Musashino, JP (2020)

Company Filing History:


Years Active: 1997-2020

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6 patents (USPTO):Explore Patents

Title: The Innovations of Kouji Hayashi

Introduction

Kouji Hayashi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, holding a total of six patents. His work has been instrumental in advancing the functionality and usability of measurement devices.

Latest Patents

Among his latest innovations is a measurement device display screen featuring a transitional graphical user interface. This patent showcases his commitment to enhancing user experience through intuitive design and advanced technology.

Career Highlights

Kouji Hayashi has had a distinguished career, working with notable companies such as Yokogawa Electric Corporation and Yokogawa Test & Measurement Corporation. His experience in these organizations has allowed him to develop cutting-edge technologies that have impacted the industry.

Collaborations

Throughout his career, Kouji has collaborated with talented individuals, including Ayako Kouno and Hisayo Ishikawa. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Kouji Hayashi's contributions to measurement technology and his innovative patents reflect his expertise and dedication to improving device functionality. His work continues to influence the industry and inspire future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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