Kanagawa, Japan

Kouji Furihata

This inventor holds 1 USPTO granted patent. Top assignee: Leader Electronics Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouji Furihata. Retrieved from https://idiyas.com/inventor/kouji-furihata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Kouji Furihata: Innovator in Electronic Scale Calibration

Introduction

Kouji Furihata is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of electronic measurement technology. His innovative work focuses on improving the accuracy and efficiency of electronic scales.

Latest Patents

Kouji Furihata holds a patent for a "Method and apparatus for calibrating electronic scales." This invention provides a method and apparatus for calibrating electronic scales specifically for the horizontal axis of an oscilloscope. The process involves generating output voltages from a horizontal deflection circuit and measuring the time interval in which the voltage of a sweep waveform passes these output voltages. The slope of the sweep waveform is adjusted to align with a target time interval, enhancing the calibration process.

Career Highlights

Furihata is currently employed at Leader Electronics Corporation, where he continues to develop innovative solutions in electronic measurement. His work has been instrumental in advancing the technology used in electronic scales.

Collaborations

Kouji has collaborated with notable colleagues, including Kenzo Ikuzawa and Kentaro Ozawa. Their combined expertise contributes to the innovative projects at Leader Electronics Corporation.

Conclusion

Kouji Furihata's contributions to the field of electronic scale calibration demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in measurement technology, showcasing his role as a leading inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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