The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 1995

Filed:

Jul. 29, 1993
Applicant:
Inventors:

Kenzo Ikuzawa, Kanagawa, JP;

Kentaro Ozawa, Kanagawa, JP;

Susumu Mogi, Kanagawa, JP;

Hirohisa Mita, Kanagawa, JP;

Kouji Furihata, Kanagawa, JP;

Assignee:

Leader Electronics Corp., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 74 ; 345 14 ; 348194 ; 327134 ;
Abstract

A method and apparatus of calibrating electronic scales for the horizontal axis of an oscilloscope is provided. For each of two electronic scales or cursors, output voltages of a horizontal deflection circuit are generated. A measurement is made to determine a time interval in which the voltage of a sweep waveform, generated by a sweep waveform generator and appearing at the output of the horizontal deflection circuit, passes the two output voltages. The slope of the sweep waveform generated by the sweep waveform generator is adjusted such that the time interval coincides with a target time interval.


Find Patent Forward Citations

Ikuzawa, Kenzo. (1995). Method and apparatus for calibrating electronic scales for the (U.S. Patent No. 5410245). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5410245

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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