Tokyo, Japan

Kotaro Asami

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Jeol Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kotaro Asami. Retrieved from https://idiyas.com/inventor/kotaro-asami

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kotaro Asami: Innovator in Sample Container Technology

Introduction

Kotaro Asami is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of analytical technology, particularly with his innovative designs that enhance measurement techniques.

Latest Patents

Asami holds a patent for a sample container and measuring method. This invention is designed for use with an X-ray fluorescence analyzer, allowing for the measurement of light elements in a liquid. The sample container features a sealable first receptacle, a pressure adjusting valve, and a second receptacle that receives a liquid sample. The analytical film in the design transmits X-rays, making it a valuable tool for precise measurements.

Career Highlights

Kotaro Asami is associated with Jeol Ltd., a company renowned for its advanced scientific instruments and analytical solutions. His work at Jeol Ltd. has positioned him as a key player in the development of innovative measurement technologies.

Collaborations

Asami collaborates with Genki Kinugasa, contributing to the advancement of their projects and enhancing the capabilities of their inventions.

Conclusion

Kotaro Asami's contributions to the field of analytical technology through his innovative sample container design exemplify the impact of dedicated inventors in advancing scientific measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…