Kort F Longenbach

Title: Kort F Longenbach: Innovator in Semiconductor Technology

Introduction

Kort F Longenbach is a notable inventor based in New York, NY (US). He has made significant contributions to the field of semiconductor technology, particularly in the area of temperature control systems for wafer testing.

Latest Patents

One of his key patents is the "Dry interface thermal chuck temperature control system for semiconductor." This innovative system is designed for use in semiconductor wafer testing apparatuses. The wafer chuck is divided into multiple temperature sensor and cooling element domains that correspond to chip location regions of an undiced wafer being tested. The system utilizes computer scanning of the sensors to identify the domain that contains the heat source, allowing for precise temperature control through a closed-loop feedback servo. Additionally, the design incorporates a helium gas interface between the wafer and the chuck, optimizing thermal resistance and maintaining vacuum hold-down.

Career Highlights

Kort F Longenbach is associated with International Business Machines Corporation (IBM), where he has contributed to advancements in semiconductor technology. His work has been instrumental in enhancing the efficiency and effectiveness of wafer testing processes.

Collaborations

He has collaborated with notable coworkers such as Stuart H Bullard and Mark R LaForce, further enriching the innovative environment at IBM.

Conclusion

Kort F Longenbach's contributions to semiconductor technology, particularly through his patented temperature control system, highlight his role as a significant inventor in the field. His work continues to influence advancements in semiconductor testing and efficiency.