This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hitachi-High-Technologies Corporation. Active years: 2013.
Company Filing History:
Years Active: 2013
Title: Koki Miyahara: Innovator in Scanning Electron Microscopy
Introduction
Koki Miyahara is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of scanning electron microscopy, particularly in methods that enhance the control of sample charging.
Latest Patents
Miyahara holds a patent for a "Method for controlling charging of sample and scanning electron microscope." The objective of this invention is to provide a scanning electron microscope that allows for the control of the quantity of electrons generated by the collision of electrons emitted from a sample with other components. This method involves a scanning electron microscope that includes multiple apertures through which an electron beam can pass, along with a mechanism for switching these apertures. By doing so, the quantity of electrons generated by collisions can be effectively controlled.
Career Highlights
Koki Miyahara is associated with Hitachi High-Technologies Corporation, where he has been able to apply his innovative ideas in practical settings. His work has led to advancements in the functionality and efficiency of scanning electron microscopes.
Collaborations
Miyahara has collaborated with notable colleagues such as Ritsuo Fukaya and Zhigang Wang. Their combined expertise has contributed to the development of advanced technologies in the field.
Conclusion
Koki Miyahara's contributions to scanning electron microscopy demonstrate his innovative spirit and commitment to advancing technology. His patent reflects a significant step forward in controlling electron interactions, which is crucial for enhancing the capabilities of electron microscopy.