Tokyo, Japan

Koji Fujimori

This inventor holds 1 USPTO granted patent. Top assignee: Beckman Coulter, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koji Fujimori. Retrieved from https://idiyas.com/inventor/koji-fujimori-ly0pvcfy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Koji Fujimori: Innovator in Optical Measurement Analysis

Introduction

Koji Fujimori is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of optical measurement analysis. His innovative work focuses on identifying abnormalities in analyzers, which are crucial for accurate specimen analysis.

Latest Patents

Fujimori holds a patent for an "Abnormality-identifying method and analyzer." This method provides a systematic approach to identifying abnormalities in an analyzer that analyzes specimens based on optical measurement. The process involves acquiring a reference value from a low-concentration reagent and an abnormality-identification measurement value from a high-concentration reagent. The method identifies abnormalities based on whether the measurement value falls within an acceptable range set by the reference value. He has 1 patent to his name.

Career Highlights

Fujimori is currently employed at Beckman Coulter, Inc., where he continues to develop innovative solutions in the field of optical measurement. His work has been instrumental in enhancing the accuracy and reliability of analytical processes.

Collaborations

Throughout his career, Fujimori has collaborated with esteemed colleagues such as Kiyotaka Kubota and Yukihiro Furusawa. These collaborations have further enriched his research and development efforts.

Conclusion

Koji Fujimori's contributions to the field of optical measurement analysis exemplify the importance of innovation in scientific research. His patented methods are paving the way for advancements in analyzer technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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