The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Apr. 13, 2009
Kiyotaka Kubota, Tokyo, JP;
Yukihiro Furusawa, Tokyo, JP;
Koji Fujimori, Tokyo, JP;
Beckman Coulter, Inc., Brea, CA (US);
Abstract
Provided is an abnormality-identifying method for identifying an abnormality in an analyzer which analyzes a specimen based on optical measurement. The method includes firstly acquiring a reference value which is a measurement result obtained by using a low-concentration reagent containing a component in predetermined very low concentrations, secondly acquiring an abnormality-identification measurement value which is a measurement result obtained through an analysis process using a high-concentration reagent containing the component in predetermined high concentrations, and identifying an abnormality in an analysis process concerning removal of the high-concentration reagent based on whether the abnormality-identification measurement value is within an acceptable range set based on the reference value.