Location History:
- Kodaira, JP (2020)
- Tokyo, JP (2023)
Company Filing History:
Years Active: 2020-2023
Title: Koichi Iwao: Innovator in Semiconductor Technology
Introduction
Koichi Iwao is a notable inventor based in Kodaira, Japan. He has made significant contributions to the field of semiconductor technology, holding two patents that showcase his innovative spirit and technical expertise.
Latest Patents
Iwao's latest patents include advancements in semiconductor integrated circuits and methods for testing these circuits. One of his patents describes a semiconductor integrated circuit that inputs and outputs signals regarding a test using two terminals. This circuit features a bidirectional terminal for data input and output, as well as an input terminal for clock signal input. The output control circuit synchronizes with the clock signal to prevent data input and output permission signals from overlapping. Another patent focuses on an inspection apparatus that includes multiple Built-In Self-Test (BIST) circuits. Each BIST circuit compares a test pattern from an inspection target circuit with an expected value, outputting a signal that indicates the comparison result. The combining unit generates a single signal through logical operations on the results from the BIST circuits, enhancing the reliability of semiconductor testing.
Career Highlights
Koichi Iwao is currently employed at Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to apply his innovative ideas in practical applications, contributing to the company's reputation for quality and technological advancement.
Collaborations
Iwao collaborates with Eiki Aoyama, a fellow innovator, to further enhance their research and development efforts in semiconductor technology.
Conclusion
Koichi Iwao's contributions to semiconductor technology through his patents and work at Canon demonstrate his commitment to innovation and excellence in the field. His inventions are paving the way for advancements in electronic equipment and testing methodologies.