Kanagawa, Japan

Koichi Hanazaki

This inventor holds 1 USPTO granted patent. Top assignee: Anritsu Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koichi Hanazaki. Retrieved from https://idiyas.com/inventor/koichi-hanazaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Koichi Hanazaki: Innovator in Measurement Instruments

Introduction

Koichi Hanazaki is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of communication technology. His innovative work has led to the development of a unique measurement instrument that enhances communication capabilities.

Latest Patents

Hanazaki holds 1 patent for his invention, which focuses on a measurement instrument for communication. This patent showcases his expertise and commitment to advancing technology in this area.

Career Highlights

Koichi Hanazaki is currently employed at Anritsu Corporation, a leading company in communication test and measurement solutions. His role at Anritsu allows him to apply his inventive skills in a practical setting, contributing to the company's reputation for innovation.

Collaborations

Throughout his career, Hanazaki has collaborated with talented individuals such as Tatsuyuki Maki and Kazuhiko Zaima. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Koichi Hanazaki is a distinguished inventor whose work in measurement instruments for communication has made a significant impact in the field. His contributions at Anritsu Corporation and collaborations with other professionals highlight his dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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