Ko Lun Chen

Title: Innovations of Ko Lun Chen

Introduction

Ko Lun Chen is a notable inventor based in Toronto, Canada. He has made significant contributions to the field of micro-nano manipulation and scanning technologies. With a total of two patents to his name, Chen's work showcases his innovative approach to solving complex problems in his field.

Latest Patents

One of Chen's latest patents is titled "Method for SEM-guided AFM scan with dynamically varied scan speed." This method discloses how topography information extracted from scanning electron microscope (SEM) images can determine the atomic force microscope (AFM) image scanning speed at each sampling point or region on a sample. The process involves three key steps: first, processing SEM images to extract possible topography features and create a feature metric map; second, converting the feature metric map into an AFM scan speed map; and third, performing the AFM scan according to the scan speed map. This method allows for higher scan speeds in areas with less topography features and lower speeds in areas rich in topography features.

Another significant patent by Chen is "Micro-nano tools with changeable tips for micro-NANO manipulation." This invention relates to a modular system designed for micro-nano manipulation of samples. The system comprises changeable tool tips provided in an array and a tool body. Each tool tip includes an end effector connected to a base with mating structures. The tool body features an arm with slits designed to detachably couple with the mating structures of the tool tip. This innovative design enhances the versatility and functionality of micro-nano manipulation tools.

Career Highlights

Throughout his career, Ko Lun Chen has worked with various organizations, including the Jiangsu Jitri Micro-nano Automation Institute Co., Ltd. His experience in these roles has contributed to his expertise in micro-nano technologies and innovations.

Collaborations

Chen has collaborated with notable individuals in his field, including Yu Sun and Jun Chen. These collaborations have likely enriched his work and led to further advancements in his research.

Conclusion

Ko Lun Chen's contributions to the field of micro-nano manipulation and scanning technologies are noteworthy. His innovative patents reflect his commitment to advancing technology and improving methodologies in his area of expertise.