This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Heavy Industries Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Kiwamu Nakajima: Innovator in Infrared Inspection Technology
Introduction
Kiwamu Nakajima is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of inspection technology, particularly through his innovative use of infrared light for detecting scratches on electroconductive materials. His work is essential in ensuring the quality and reliability of various products.
Latest Patents
Kiwamu Nakajima holds a patent for an "Inspection device and inspection method with infrared light for scratch detection on inspection target." This device includes an infrared acquisition unit that detects infrared light from an inspection target, which consists of an electroconductive member. The invention also features an intensity-determining unit that assesses the detection intensity of the infrared light, along with a scratch-determining unit that identifies the presence of scratches based on this intensity.
Career Highlights
Kiwamu Nakajima is currently employed at Mitsubishi Heavy Industries Limited, where he continues to develop and refine his innovative technologies. His work at this prestigious company has allowed him to contribute to advancements in inspection methods that are crucial for various industrial applications.
Collaborations
Some of Kiwamu Nakajima's coworkers include Yuki Yano and Nobuyuki Kamihara. Their collaboration fosters a creative environment that enhances the development of cutting-edge technologies in the field.
Conclusion
Kiwamu Nakajima's contributions to infrared inspection technology exemplify the importance of innovation in ensuring product quality. His patent and ongoing work at Mitsubishi Heavy Industries Limited highlight his role as a key figure in advancing inspection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
