The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Jan. 31, 2022
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Yuki Yano, Tokyo, JP;

Nobuyuki Kamihara, Tokyo, JP;

Takayuki Moritake, Tokyo, JP;

Kohei Kawazoe, Tokyo, JP;

Kiwamu Nakajima, Tokyo, JP;

Toshinobu Muraki, Tokyo, JP;

Yusuke Hashida, Tokyo, JP;

Kanata Fujii, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/84 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/8422 (2013.01); G01N 21/8806 (2013.01); G01N 21/958 (2013.01); G01N 2021/8427 (2013.01); G01N 2021/8848 (2013.01);
Abstract

An inspection device includes an infrared acquisition unit for acquiring infrared light detected by an infrared camera for detecting infrared light from an inspection target that includes an electroconductive member, an intensity-determining unit for determining a detection intensity of the infrared light, and a scratch-determining unit for determining whether or not there is a scratch on the electroconductive member based on the detection intensity of the infrared light.


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