This inventor holds 3 USPTO granted patents. Top assignees: Asahi Glass Company, Limited, Asahi Glass Company, Limted. Active years: 2015-2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015-2018
Title: Kimiaki Ohto: Innovator in Shape Measurement Technology
Introduction
Kimiaki Ohto is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of shape measurement technology, holding a total of 3 patents. His work focuses on developing innovative devices and methods that enhance the accuracy and efficiency of measuring three-dimensional shapes.
Latest Patents
Ohto's latest patents include a shape measuring device, a shape measuring method, and a glass plate manufacturing method. The shape measuring device features a predetermined pattern and an image pick-up section that captures reflected images from both the front and back faces of a transparent measurement object. It includes a calculating section that determines the inclination angle of at least one face and a determining section that establishes the shape of the object. The predetermined pattern consists of multiple elements, with each element's ends deviating from each other in the extension direction. His technology allows for three-dimensional shape measurement using a stereo method, even on objects with specular surfaces.
Career Highlights
Throughout his career, Kimiaki Ohto has worked with prominent companies, including Asahi Glass Company, Limited. His experience in these organizations has contributed to his expertise in the field of glass manufacturing and shape measurement technologies.
Collaborations
Ohto has collaborated with notable colleagues such as Akira Sugahara and Yusuke Arita. Their combined efforts have further advanced the development of innovative technologies in their respective fields.
Conclusion
Kimiaki Ohto's contributions to shape measurement technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in measuring three-dimensional shapes, making him a significant figure in this area of research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
