The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Jun. 21, 2016
Applicant:

Asahi Glass Company, Limited, Chiyoda-ku, JP;

Inventors:

Kimiaki Ohto, Tokyo, JP;

Akira Sugahara, Tokyo, JP;

Yusuke Arita, Tokyo, JP;

Minoru Ikenota, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03B 18/18 (2006.01); G01B 11/25 (2006.01); C03B 25/08 (2006.01);
U.S. Cl.
CPC ...
C03B 18/18 (2013.01); G01B 11/25 (2013.01); G01B 11/2513 (2013.01); C03B 25/08 (2013.01);
Abstract

A shape measuring device includes: a predetermined pattern; an image pick-up section that captures reflected images of the predetermined pattern on the front face and back face of a transparent measurement object; a calculating section that calculates an inclination angle of at least the front face or the back face from the reflected images; and a determining section that determines a shape of at least the front face or the back face. The predetermined pattern includes a plurality of elements, and one end and the other end of each element of the plurality of elements, which are formed in a direction perpendicular to the extension direction, are deviated from each other in the extension direction.


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