This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Kihong Chung: Innovator in Substrate Inspection Technology
Introduction
Kihong Chung is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of substrate inspection technology. His innovative approach has led to the development of a unique method that enhances the accuracy of substrate analysis.
Latest Patents
Kihong Chung holds a patent for a substrate inspection method. This method involves radiating light onto a substrate and extracting a spectrum that represents the intensity of light reflected from the substrate. The process includes analyzing the extracted spectrum in various units, such as an entire substrate, a shot, a chip, and a block. Furthermore, it generates a spectrum distribution map that indicates reflectivity for each wavelength band. This innovative technique allows for the extraction of weak points in the substrate based on the spectrum distribution map. He has 1 patent to his name.
Career Highlights
Kihong Chung is currently employed at Samsung Electronics Ltd., a leading company in the technology sector. His work at Samsung has allowed him to apply his expertise in substrate inspection, contributing to the company's advancements in technology and innovation.
Collaborations
Kihong Chung has collaborated with talented individuals such as Kiwook Song and Seungryeol Oh. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Kihong Chung's contributions to substrate inspection technology exemplify the impact of innovative thinking in the field. His patent and work at Samsung Electronics Ltd. highlight his role as a key player in advancing technology.