Company Filing History:
Years Active: 2008-2009
Title: Ki-Suk Chung: Innovator in Defect Inspection Technologies
Introduction
Ki-Suk Chung is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of defect inspection technologies, holding a total of 3 patents. His work focuses on innovative methods and apparatuses that enhance the accuracy and efficiency of defect detection in various objects.
Latest Patents
One of Ki-Suk Chung's latest patents is a method of inspecting for defects. This method involves irradiating a bare object with a first light, which generates a first reflection signal. A second light is then directed onto a processed object, producing a second reflection signal. By differentiating these signals, Chung's method allows for the detection of defects on the processed object through a comparison of the first and second differential signals. The signals are analyzed to identify any deviations that indicate defects.
Another notable patent is a method of classifying defects. This method utilizes multi-wavelength light to irradiate an object, splitting the reflected light into beams of different wavelengths. By obtaining image information based on these beams, Chung creates a characteristic matrix that represents the wavelengths and image data. This matrix is then analyzed to accurately classify the types of defects present on the object, leveraging the differences in reactivity of each defect under varying wavelengths and inspection conditions.
Career Highlights
Ki-Suk Chung is currently employed at Samsung Electronics Co., Ltd., where he continues to develop innovative technologies in defect inspection. His work has significantly impacted the quality control processes within the electronics industry, ensuring that products meet high standards of excellence.
Collaborations
Throughout his career, Ki-Suk Chung has collaborated with talented individuals such as Yu-sin Yang and Byung-Sug Lee. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Ki-Suk Chung's contributions to defect inspection technologies exemplify the importance of innovation in enhancing product quality. His patents reflect a commitment to advancing methods that improve accuracy in defect detection, making a lasting impact in the field.