Ki-hyun Park

Title: Ki-hyun Park: Innovator in Built-in Self-Test Circuits

Introduction

Ki-hyun Park is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of memory devices and testing circuits. With a total of 3 patents to his name, Park continues to push the boundaries of technology.

Latest Patents

His latest patents include a built-in self-test (BIST) circuit and a method of operating the BIST circuit. The BIST circuit is designed to generate a test pattern based on various test parameters, including a first and second test parameter. This innovative circuit performs tests on at least one memory core. The method involves setting a sweep range that includes a sweep start point and a sweep end point of the first test parameter. It generates a first test pattern corresponding to each sweep point and provides this pattern to the memory core. The output data from the memory core is then compared to predetermined reference data, leading to the generation of first test result information based on the comparison results.

Career Highlights

Ki-hyun Park is currently employed at Samsung Electronics Co., Ltd., where he applies his expertise in developing advanced memory technologies. His work has been instrumental in enhancing the reliability and efficiency of memory devices.

Collaborations

Throughout his career, Park has collaborated with talented individuals such as Seung-ho Ok and Pyung-moon Zhang. These collaborations have contributed to the successful development of innovative technologies in the field.

Conclusion

Ki-hyun Park is a distinguished inventor whose work in built-in self-test circuits has made a significant impact on memory device technology. His contributions continue to shape the future of electronic testing and memory reliability.