Cheonan, South Korea

Ki-Hun Jeong

This inventor holds 82 USPTO granted patents and 3 published patent applications and 3 EPO patents, primarily in Display Technology (CPC class G06F3-0412). Top assignees: Samsung Display Co., Ltd., Samsung Electronics Co., Ltd., Korea Advanced Institute of Science and Technology. Active years: 2009-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ki-Hun Jeong. Retrieved from https://idiyas.com/inventor/ki-hun-jeong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 82 

% Patents Active = 69.5

 

Average Co-Inventor Count = 4.9

ph-index = 6

Forward Citations = 159(Granted Patents)

Forward Citations (Not Self Cited) = 154(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Chungcheongnam-do, KR (2012)
  • Cheongan-si, KR (2011 - 2016)
  • Cheonan-si, KR (2010 - 2017)
  • Daejeon-si, KR (2013 - 2018)
  • Seoul, KR (2009 - 2022)
  • Daejeon, KR (2015 - 2024)

Company Filing History:


Years Active: 2009-2026

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Areas of Expertise:
Polymerase Chain Reaction
Microlens Array
Nanocomposite Nanostructure
Ultrathin Camera
Optical Scanning
Biometric Authentication
Gradient Index Lens
Visible Sensing Transistor
Touch Screen Substrate
Laser-Induced Ultrasound
Thin Film Transistor
Spectroscopic Apparatus
82 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Ki-Hun Jeong in Optical and Sensor Technologies

Introduction

Ki-Hun Jeong, a prolific inventor based in Cheonan-si, South Korea, holds an impressive portfolio of 80 patents. His innovative work primarily focuses on advanced optical technologies and sensors, significantly impacting medical diagnostics and environmental sensing.

Latest Patents

Among his notable recent inventions is the Microlens Array-Based Ultrathin Microscope. This device is designed to enhance imaging capabilities by utilizing a filter unit that selectively transmits fluorescence from measurement samples. The innovative design includes a microlens array and an image sensor that works in conjunction to acquire high-quality images. This microscope has the potential to revolutionize fluorescence microscopy by providing ultrathin and highly sensitive imaging solutions.

Another groundbreaking patent is the development of a Nanocomposite Nanostructure-Based Surface-Enhanced Raman Scattering Respiratory Droplet Mask Sensor. This advanced sensor features a fine particle-trapping capability, employing a plasmonic hotspot layer and a trapping layer. The technology allows for real-time detection of respiratory droplets, making it particularly valuable in monitoring infectious diseases. The ability to detect SARS-CoV-2 at a concentration of as low as 10 pfu/ml highlights its potential for significant contributions in public health.

Career Highlights

Ki-Hun Jeong has been associated with leading technologies, working with notable companies such as Samsung Display Co., Ltd. and Samsung Electronics Co., Ltd. His work within these organizations has allowed him to leverage the latest innovations and collaborate on projects that are at the forefront of technology development.

Collaborations

Throughout his career, Ki-Hun has collaborated with esteemed colleagues, including Sung-Hoon Yang and Seung-Hwan Shim. These partnerships have facilitated the exchange of ideas and expertise, further enhancing the quality and impact of their inventions in the field.

Conclusion

Ki-Hun Jeong's contributions to innovation, particularly in microscopy and sensor technologies, demonstrate his dedication to advancing science and improving public health. His impressive portfolio of patents showcases his ability to create impactful solutions that address real-world challenges. As he continues to innovate, his work will undoubtedly shape the future of technology and medicine.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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