The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Aug. 25, 2021
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Ki-Hun Jeong, Daejeon, KR;
Kyung-Won Jang, Daejeon, KR;
Byounghoon Kang, Daejeon, KR;
Younggil Cha, Daejeon, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Abstract
A microlens array-based ultrathin microscope is provided. The microlens array-based ultrathin microscope includes a filter unit configured to selectively transmit fluorescence manifested in a measurement sample, and an image unit configured to acquire an image from light transmitted by the filter unit. The filter unit is formed to be in contact with or spaced apart from one surface of a transparent substrate, and the image unit includes a microlens array formed on an opposite surface to the transparent substrate in which the filter unit is formed, and an image sensor configured to collect image information of the microlens array.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile