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Austin, TX, United States of America

Kevin R Lensing

USPTO Granted Patents = 41

Average Co-Inventor Count = 2.1

ph-index = 10

Forward Citations = 388(Granted Patents)

Company Filing History:

37 out of 12,883

Advanced Micro Devices Corporation

Globalfoundries Inc.

Years Active: 2002-2012

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Areas of Expertise:

Scatterometry

Metrology Data

Semiconductor Manufacturing

Epitaxial Silicon Film

Statistical Process Control

Optical Film Stack

Photolithography Processes

Device Testing

Electromigration Analysis

Calibration Techniques

Trench Depth Analysis

Process Optimization

41 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8149384 - Method and apparatus for extracting dose and focus from critical dimension data (2012-04-03),

2. 8041518 - Determining die test protocols based on process health (2011-10-18),

3. 7983871 - Method and apparatus for employing previous test insertion results for testing a device (2011-07-19),

4. 7925369 - Method and apparatus for optimizing models for extracting dose and focus from critical dimension (2011-04-12),

5. 7838308 - Method of controlling embedded material/gate proximity (2010-11-23),

6. 7822567 - Method and apparatus for implementing scaled device tests (2010-10-26),

7. 7738986 - Method and apparatus for compensating metrology data for site bias prior to filtering (2010-06-15),

8. 7716004 - Method and apparatus for matching test equipment calibration (2010-05-11),

9. 7682845 - Methods for calibrating a process for growing an epitaxial silicon film and methods for growing an epitaxial silicon film (2010-03-23),

10. 7519447 - Method and apparatus for integrating multiple sample plans (2009-04-14),

11. 7502702 - Method and apparatus for dynamic adjustment of sensor and/or metrology sensitivities (2009-03-10),

12. 7337034 - Method and apparatus for determining a root cause of a statistical process control failure (2008-02-26),

13. 7282374 - Method and apparatus for comparing device and non-device structures (2007-10-16),

14. 7277824 - Method and apparatus for classifying faults based on wafer state data and sensor tool trace data (2007-10-02),

15. 7262864 - Method and apparatus for determining grid dimensions using scatterometry (2007-08-28),

Title: The Innovative Journey of Kevin R Lensing

Introduction: Kevin R Lensing is a pioneering inventor based in Austin, Texas, known for his groundbreaking contributions to various technological fields.

Latest Patents: Kevin R Lensing holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Kevin R Lensing has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized industries.

Collaborations: Throughout his career, Kevin R Lensing has collaborated with top engineers, scientists, and researchers, fostering a culture of innovation and excellence in all his projects.

Conclusion: Kevin R Lensing's relentless pursuit of innovation and his passion for creating impactful solutions continue to inspire the next generation of inventors and entrepreneurs.

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