Enter inventor name

Kevin R Lensing

This inventor holds 41 USPTO granted patents, primarily in Semiconductor Metrology. Top assignees: Advanced Micro Devices Corporation, Globalfoundries Inc.. Active years: 2002-2012.

USPTO Granted Patents = 41

% Patents Active = 65.9

Average Co-Inventor Count = 2.1

ph-index = 10

Forward Citations = 393(Granted Patents)

Company Filing History:

37 out of 13,157

Advanced Micro Devices Corporation

Years Active: 2002-2012

Loading Chart...

Areas of Expertise:

Scatterometry

Semiconductor Manufacturing

Process Control

Metrology

Epitaxial Silicon Film

Calibration

Fault Detection

Overlay Measurements

Photoresist Etch

Device Testing

Electromigration

Trench Analysis

41 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8149384 - Method and apparatus for extracting dose and focus from critical dimension data (2012-04-03),

2. 8041518 - Determining die test protocols based on process health (2011-10-18),

3. 7983871 - Method and apparatus for employing previous test insertion results for testing a device (2011-07-19),

4. 7925369 - Method and apparatus for optimizing models for extracting dose and focus from critical dimension (2011-04-12),

5. 7838308 - Method of controlling embedded material/gate proximity (2010-11-23),

6. 7822567 - Method and apparatus for implementing scaled device tests (2010-10-26),

7. 7738986 - Method and apparatus for compensating metrology data for site bias prior to filtering (2010-06-15),

8. 7716004 - Method and apparatus for matching test equipment calibration (2010-05-11),

9. 7682845 - Methods for calibrating a process for growing an epitaxial silicon film and methods for growing an epitaxial silicon film (2010-03-23),

10. 7519447 - Method and apparatus for integrating multiple sample plans (2009-04-14),

11. 7502702 - Method and apparatus for dynamic adjustment of sensor and/or metrology sensitivities (2009-03-10),

12. 7337034 - Method and apparatus for determining a root cause of a statistical process control failure (2008-02-26),

13. 7282374 - Method and apparatus for comparing device and non-device structures (2007-10-16),

14. 7277824 - Method and apparatus for classifying faults based on wafer state data and sensor tool trace data (2007-10-02),

15. 7262864 - Method and apparatus for determining grid dimensions using scatterometry (2007-08-28),

Title: The Innovative Journey of Kevin R Lensing

Introduction: Kevin R Lensing is a pioneering inventor based in Austin, Texas, known for his groundbreaking contributions to various technological fields.

Latest Patents: Kevin R Lensing holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Kevin R Lensing has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized industries.

Collaborations: Throughout his career, Kevin R Lensing has collaborated with top engineers, scientists, and researchers, fostering a culture of innovation and excellence in all his projects.

Conclusion: Kevin R Lensing's relentless pursuit of innovation and his passion for creating impactful solutions continue to inspire the next generation of inventors and entrepreneurs.

Profile summary based on public USPTO records.

Please report any incorrect information to [email protected]