Lakewood, CO, United States of America

Kevin Finch

This inventor holds 1 USPTO granted patent. Top assignee: Tda Research, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kevin Finch. Retrieved from https://idiyas.com/inventor/kevin-finch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kevin Finch and Carbon Fiber Laminate Inspection

Introduction

Kevin Finch is an inventor based in Lakewood, Colorado, whose patent work addresses the detection of flaws in carbon fiber laminates. His invention is designed for both on-board and laboratory inspection of thick or thin laminate materials.

Latest Patents

Finch is associated with 1 patent: “Electromagnetic Inductive Coupling Analysis (EMICA) for On-Board or In-Lab Detection of Defects in Thick or Thin Carbon Fiber Laminates.” The patent describes a device and method for identifying flaws in carbon fiber laminates. It uses an alternating-current excitor-detector, an impedance-matched RLC circuit, and a vector network analyzer. The device can produce a two-dimensional or three-dimensional representation indicating the location of a flaw.

Career Highlights

Finch’s patent work focuses on applying electromagnetic inductive coupling to the inspection of composite materials. The approach is intended to help locate defects in carbon fiber laminates in both field and laboratory settings. He is associated with TDA Research, Inc.

Collaborations

The provided information identifies Joshua R. Biller and David Long as Finch’s coworkers. Their names are associated with his professional context, though specific collaborative roles are not detailed.

Conclusion

Kevin Finch’s patented EMICA technology offers a method for locating defects in carbon fiber laminates, with potential use in both on-board and laboratory inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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